TABLE 5

Mean and SD of Misregistration Parameters of Implementation Using Different Levels of Resolution and Sampling

Level	Misregistration parameter						Time (s)	Success rate (%)
Level	δθ_x (deg)	δθ_y (deg)	δθ_z (deg)	δt_x (mm)	δt_y (mm)	δt_z (mm)	Time (s)	Success rate (%)
R1	−0.36 ± 0.99	−0.04 ± 0.52	0.12 ± 0.69	−0.08 ± 0.27	0.26 ± 0.60	0.06 ± 0.26	225	62
R2	0.13 ± 0.54	0.32 ± 0.67	0.10 ± 0.54	0.12 ± 0.38	−0.06 ± 0.35	−0.07 ± 0.55	186	86
R3	0.26 ± 0.80	0.08 ± 0.55	0.03 ± 0.74	0.16 ± 0.39	−0.07 ± 0.48	0.11 ± 0.55	181	95
S1	0.06 ± 0.74	0.03 ± 0.72	−0.25 ± 0.81	0.59 ± 0.65	1.18 ± 0.46	−1.79 ± 1.26	216	86
S2	0.25 ± 0.94	0.38 ± 0.86	0.11 ± 0.68	0.71 ± 0.69	1.11 ± 0.80	−1.91 ± 1.18	197	95
S3	−0.08 ± 0.79	0.19 ± 0.67	0.01 ± 0.66	0.59 ± 0.63	1.32 ± 0.65	−1.91 ± 0.96	211	86
S4	0.49 ± 0.86	0.32 ± 0.90	0.18 ± 0.81	0.61 ± 0.71	0.90 ± 0.46	−2.09 ± 1.00	215	86

R1–R3 = multiresolution technique with 1, 2, or 3 resolution levels; S1–S4 = subsampling technique with 1, 2, 3, or 4 subsampling levels.