Results of Leave-One-Out Cross-Validation
| Parameter | 18F-FET | Cho/NAA |
|---|---|---|
| Mean AUC ± SD | 0.89 ± 0.003 | 0.81 ± 0.004 |
| Mean threshold ± SD | 1.4 ± 0.01 | 2.16 ± 0.04 |
| Accuracy | 0.78 | 0.71 |
| Sensitivity | 0.76 | 0.59 |
| Specificity | 0.80 | 0.83 |
| Positive predictive value | 0.79 | 0.78 |
| Negative predictive value | 0.77 | 0.67 |