JNM -- Index by Author (Dec 2005; Volume 46, Number 12)

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Index by Author: Dec 2005; 46 (12) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Andersson, Håkan [Abstract] [Full Text]; Arveux, Patrick [Abstract] [Full Text]
B: Bacher, Klaus [Abstract] [Full Text]; Bäck, Tom [Abstract] [Full Text]; Ballinger, James R. [Full Text]; Bax, Jeroen J. [Abstract] [Full Text]; Bedenne, Laurent [Abstract] [Full Text]; Beer, Ambros J. [Abstract] [Full Text]; Beerens, Antoine M.J. [Abstract] [Full Text]; Bennaghmouch, Abdelkader [Abstract] [Full Text]; Bey, Pierre [Abstract] [Full Text]; Bismuth, Marie J. [Abstract] [Full Text]; Bleeker-Rovers, Chantal P. [Abstract] [Full Text]; Boecker, Henning [Abstract] [Full Text]; Boersma, Hendrikus H. [Abstract] [Full Text]; Boswell, C. Andrew [Full Text]; Brambilla, Marco [Abstract] [Full Text]; Brechbiel, Martin W. [Full Text]; Bredow, Jan [Abstract] [Full Text]; Brevetti, Gregorio [Abstract] [Full Text]; Brogsitter, Claudia [Abstract] [Full Text]; Buell, Ulrich [Full Text]; Buursma, Anne Rixt [Abstract] [Full Text]
C: Chiariello, Massimo [Abstract] [Full Text]; Conroy, Thierry [Abstract] [Full Text]; Cornelissen, Bart [Abstract] [Full Text]; Corstens, Frans H.M. [Abstract] [Full Text]; Costes, Nicolas [Abstract] [Full Text]; Cuocolo, Alberto [Abstract] [Full Text]
D: De Geeter, Frank W. [Full Text]; de Jong, Marion [Abstract] [Full Text]; De Spiegeleer, Bart [Abstract] [Full Text]; de Vries, Erik F.J. [Abstract] [Full Text]; DeKosky, Steven T. [Abstract] [Full Text]; Dierckx, Rudi A. [Abstract] [Full Text]; Dittmar, Claus [Abstract] [Full Text]; Divgi, Chaitanya R. [Abstract] [Full Text]; Dominietto, Marco [Abstract] [Full Text]
E: Eidherr, Harald [Abstract] [Full Text]; Elhendy, Abdou [Abstract] [Full Text]; Essman, Stephanie C. [Abstract] [Full Text]
F: Faillenot, Isabelle [Abstract] [Full Text]; Faivre, Jean [Abstract] [Full Text]; Feringa, Harm H. [Abstract] [Full Text]; Filardi, Pasquale Perrone [Abstract] [Full Text]; Fischer, Michael [Abstract] [Full Text]; Freed, Barry R. [Full Text]
G: Galldiks, Norbert [Abstract] [Full Text]; Garlip, Guido [Abstract] [Full Text]; Ginj, Mihaela [Abstract] [Full Text]; Graf, Senta [Abstract] [Full Text]; Guillemin, Francis [Abstract] [Full Text]
H: Haisma, Hidde J. [Abstract] [Full Text]; Hartung, Dagmar [Abstract] [Full Text]; Heidendal, Guido A.K. [Abstract] [Full Text]; Heiss, Wolf-Dieter [Abstract] [Full Text]; Henriksen, Gjermund [Abstract] [Full Text]; Herholz, Karl [Abstract] [Full Text]; Heston, Thomas F. [Abstract] [Full Text]; Hilker, Rüdiger [Abstract] [Full Text]; Hinni, Karin [Abstract] [Full Text]; Hofstra, Leo [Abstract] [Full Text]; Hofstra, Leonard [Abstract] [Full Text]; Hoge, Jessica A. [Abstract] [Full Text]; Hospers, Geke A.P. [Abstract] [Full Text]; Huijmans, Jan G.M. [Abstract] [Full Text]; Hultborn, Ragnar [Abstract] [Full Text]; Huurman, Aukje [Abstract] [Full Text]
I: Inglese, Eugenio [Abstract] [Full Text]; Iwasaki, Jinei [Abstract] [Full Text]
J: Jacobs, Andreas H. [Abstract] [Full Text]; Jacobsson, Lars [Abstract] [Full Text]; Jensen, Holger [Abstract] [Full Text]
K: Kagawa, Shinya [Abstract] [Full Text]; Kersemans, Ken [Abstract] [Full Text]; Kersemans, Veerle [Abstract] [Full Text]; Kessler, Horst [Full Text]; Khorsand, Aliasghar [Abstract] [Full Text]; Kietselaer, Bas L.J.H. [Abstract] [Full Text]; Kim, E. Edmund [Full Text]; Kishibe, Yoshihiko [Abstract] [Full Text]; Kittner, Thomas [Abstract] [Full Text]; Klein, Johannes C. [Abstract] [Full Text]; Kletter, Kurt [Abstract] [Full Text]; Klunk, William E. [Abstract] [Full Text]; Kolodgie, Frank [Abstract] [Full Text]; Kotzerke, Jörg [Abstract] [Full Text]; Kracht, Lutz W. [Abstract] [Full Text]; Krenning, Eric P. [Abstract] [Full Text]; Kudoh, Takashi [Abstract] [Full Text]; Kullberg, Bart-Jan [Abstract] [Full Text]
L: Lam, Marnix G.E.H. [Full Text]; Lavenne, Franck [Abstract] [Full Text]; Le Bars, Didier [Abstract] [Full Text]; Lejeune, Catherine [Abstract] [Full Text]; Lewis, Michael R. [Abstract] [Full Text]; Li, Huongfeng [Abstract] [Full Text]; Lindegren, Sture [Abstract] [Full Text]; Lopresti, Brian J. [Abstract] [Full Text]; Lordick, Florian [Abstract] [Full Text]; Lu, Xueling [Abstract] [Full Text]
M: Maecke, Helmut R. [Abstract] [Full Text]; Matheoud, Roberta [Abstract] [Full Text]; Mathis, Chester A. [Abstract] [Full Text]; McEwan, Alexander J.B. [Full Text]; Meltzer, Carolyn C. [Abstract] [Full Text]; Merlet, Isabelle [Abstract] [Full Text]; Mertens, John [Abstract] [Full Text]; Miller, William H. [Abstract] [Full Text]
N: Nakada, Kunihiro [Full Text]; Narula, Jagat [Abstract] [Full Text]; Narula, Jagat [Abstract] [Full Text]; Narula, Navneet [Abstract] [Full Text]
O: Ostrowsky, Karine [Abstract] [Full Text]; Ott, Katja [Abstract] [Full Text]; Oyen, Wim J.G. [Abstract] [Full Text]
P: Palm, Stig [Abstract] [Full Text]; Pellegrino, Teresa [Abstract] [Full Text]; Petretta, Mario [Abstract] [Full Text]; Petrov, Artiom [Abstract] [Full Text]; Pinkert, Jörg [Abstract] [Full Text]; Poldermans, Don [Abstract] [Full Text]; Porenta, Gerold [Abstract] [Full Text]; Price, Julie C. [Abstract] [Full Text]
R: Reinartz, Patrick [Full Text]; Reutelingsperger, Chris [Abstract] [Full Text]; Reutelingsperger, Chris P.M. [Abstract] [Full Text]; Rots, Marianne G. [Abstract] [Full Text]; Rummeny, Ernst J. [Abstract] [Full Text]; Ryvlin, Philippe [Abstract] [Full Text]
S: Sacchetti, Gianmauro [Abstract] [Full Text]; Salvatore, Marco [Abstract] [Full Text]; Sarai, Masayoshi [Abstract] [Full Text]; Schimmel, Kurt [Abstract] [Full Text]; Schinkel, Arend F.L. [Abstract] [Full Text]; Schulz, Stefan [Abstract] [Full Text]; Schuster, Ernst [Abstract] [Full Text]; Schwaiger, Markus [Abstract] [Full Text]; Secco, Chiara [Abstract] [Full Text]; Siewer, Jörg R. [Abstract] [Full Text]; Sigg, Daniel M. [Abstract] [Full Text]; Silvestro, Antonio [Abstract] [Full Text]; Slegers, Guido [Abstract] [Full Text]; Sobesky, Jan [Abstract] [Full Text]; Sochor, Heinz [Abstract] [Full Text]; Sorrentino, Anna Rita [Abstract] [Full Text]; Spilker, Mary E. [Abstract] [Full Text]; Sprenger, Till [Abstract] [Full Text]; Stolk, Leo M.L. [Abstract] [Full Text]; Storto, Giovanni [Abstract] [Full Text]
T: Thierens, Hubert [Abstract] [Full Text]; Thomas, Anne [Abstract] [Full Text]; Toelle, Thomas R. [Abstract] [Full Text]; Tschumi, Sibylle [Abstract] [Full Text]; Tsopelas, Nicholas D. [Abstract] [Full Text]
V: Vaalburg, Willem [Abstract] [Full Text]; Valkema, Roelf [Abstract] [Full Text]; Valkema, Roelf [Abstract] [Full Text]; van der Meer, Jos W.M. [Abstract] [Full Text]; van Domburg, Ron T. [Abstract] [Full Text]; van Isselt, Johannes W. [Full Text]; van Waarde, Aren [Abstract] [Full Text]; Verjans, Johan [Abstract] [Full Text]; Verwijnen, Suzanne M. [Abstract] [Full Text]; Virmani, Renu [Abstract] [Full Text]; Vollmar, Stefan [Abstract] [Full Text]; Vos, Fidel J. [Abstract] [Full Text]
W: Wadsak, Wolfgang [Abstract] [Full Text]; Wanten, Geert J.A. [Abstract] [Full Text]; Weber, Wolfgang A. [Abstract] [Full Text]; Wester, Hans-Jürgen [Full Text]; Wieder, Hinrich A. [Abstract] [Full Text]; Wienhard, Klaus [Abstract] [Full Text]
Y: Yamauchi, Hiroshi [Abstract] [Full Text]
Z: Zanni, Catherine [Abstract] [Full Text]; Ziegler, Sibylle [Abstract] [Full Text]; Zimmer, Luc [Abstract] [Full Text]; Ziolko, Scott K. [Abstract] [Full Text]