JNM -- Index by Author (Feb 2003; Volume 44, Number 2)

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Index by Author: Feb 2003; 44 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Alazraki, Naomi [Abstract] [Full Text]; Audenaert, Kurt [Abstract] [Full Text]
B: Ballangrud, Åse M. [Abstract] [Full Text]; Bax, Jeroen J. [Abstract] [Full Text]; Bax, Jeroen J. [Abstract] [Full Text]; Boersma, Eric [Abstract] [Full Text]; Borges-Neto, Salvador [Abstract] [Full Text]; Bormans, Guy M. [Abstract] [Full Text]; Brenner, Winfried [Abstract] [Full Text]; Britton, Keith E. [Full Text]; Bronfman, Francesca [Abstract] [Full Text]; Bruland, Øyvind S. [Abstract] [Full Text]; Brümmer, Corinna [Abstract] [Full Text]; Burger, Cyrill [Abstract] [Full Text]; Burnette, Joy [Abstract] [Full Text]
C: Cerqueira, Manuel [Abstract] [Full Text]; Chung, Hsiao-Wen [Full Text]; Coaguila, Carlos [Abstract] [Full Text]; Cohade, Christian [Abstract] [Full Text]; Cohade, Christian [Abstract] [Full Text]; Comtat, Claude [Abstract] [Full Text]; Conte, Matteo [Abstract] [Full Text]; Crémieux, Anne-Claude [Full Text]; Czech, Norbert [Abstract] [Full Text]
D: Daou, Doumit [Abstract] [Full Text]; Das, Satya S. [Full Text]; de Groot, Tjibbe J. [Abstract] [Full Text]; de Vries, Elisabeth G.E. [Abstract] [Full Text]; Dehdashti, Farrokh [Abstract] [Full Text]; Delbeke, Dominique [Full Text]; Dierckx, Rudi A. [Abstract] [Full Text]; Divgi, Chaitanya R. [Abstract] [Full Text]; Dumont, Filip [Abstract] [Full Text]
E: Elhendy, Abdou [Abstract] [Full Text]; Endou, Hitoshi [Abstract] [Full Text]
F: Finn, Ronald D. [Abstract] [Full Text]; Fisher, Darrell R. [Abstract] [Full Text]; Fourme, Thierry [Abstract] [Full Text]; Frusciante, Vincenzo [Abstract] [Full Text]
G: Gilissen, Christa [Abstract] [Full Text]; Gimsing, Peter [Abstract] [Full Text]; Goethals, Ingeborg [Abstract] [Full Text]; Goldsmith, Stanley J. [Abstract] [Full Text]; Grigsby, Perry W. [Abstract] [Full Text]
H: Hasegawa, Bruce [Full Text]; Hasegawa, Bruce [Abstract] [Full Text]; Hawkins, Randall [Full Text]; Hendel, Helle W. [Abstract] [Full Text]; Hendel, Robert [Abstract] [Full Text]; Henriksen, Gjermund [Abstract] [Full Text]; Henze, Eberhard [Abstract] [Full Text]; Hesse, Birger [Abstract] [Full Text]; Ho, Chi-Lai [Abstract] [Full Text]; Huberty, John [Full Text]
I: Inatomi, Jun [Abstract] [Full Text]; Ishikawa, Nobuyoshi [Abstract] [Full Text]
J: Jager, Piet L. [Abstract] [Full Text]; Jønsson, Viggo [Abstract] [Full Text]
K: Kam, Boen L.R. [Abstract] [Full Text]; Kampen, Willm Uwe [Abstract] [Full Text]; Kanai, Yoshikatsu [Abstract] [Full Text]; Kaufmann, Philipp A. [Abstract] [Full Text]; Kawai, Keiichi [Abstract] [Full Text]; Kema, Ido P. [Abstract] [Full Text]; Kim, Do Kyung [Abstract] [Full Text]; Kinahan, Paul E. [Abstract] [Full Text]; Kitagawa, Yoshimasa [Abstract] [Full Text]; Koepfli, Pascal [Abstract] [Full Text]; Kolbert, Katherine S. [Abstract] [Full Text]; Kostakoglu, Lale [Abstract] [Full Text]; Krawczynska, Elizabeth [Abstract] [Full Text]; Krenning, Eric P. [Abstract] [Full Text]
L: Larsen, Roy H. [Abstract] [Full Text]; Larson, Steven M. [Abstract] [Full Text]; Lartizien, Carole [Abstract] [Full Text]; Lauer, Michael S. [Abstract] [Full Text]; Le Guludec, Dominique [Abstract] [Full Text]; Le Guludec, Dominique [Full Text]; Leal, Jeff P. [Abstract] [Full Text]; Lebtahi, Rachida [Abstract] [Full Text]; Lin, Michael [Abstract] [Full Text]
M: Maddahi, Jamshid [Abstract] [Full Text]; Marshall, Laura T. [Abstract] [Full Text]; Matthay, Katherine K. [Full Text]; Meijer, Wim G. [Abstract] [Full Text]; Mertens, John [Abstract] [Full Text]; Meulemans, Alain [Full Text]; Mikolajczyk, Krzysztof [Abstract] [Full Text]; Miller, Tom R. [Abstract] [Full Text]; Modoni, Sergio [Abstract] [Full Text]; Muhle, Claus [Abstract] [Full Text]
N: Nagao, Michinobu [Full Text]; Nakamoto, Yuji [Abstract] [Full Text]; Nakamura, Mikiko [Abstract] [Full Text]; Nishizawa, Sadahiko [Abstract] [Full Text]
O: Ogasawara, Toshiyuki [Abstract] [Full Text]; Osman, Medhat [Abstract] [Full Text]; Osman, Medhat M. [Abstract] [Full Text]
P: Pacini, Furio [Full Text]; Panageas, Katherine S. [Abstract] [Full Text]; Pannu, Harpreet K. [Abstract] [Full Text]; Pedersen, Heidi [Abstract] [Full Text]; Piers, Bert A. [Abstract] [Full Text]; Pinkus, Edward [Abstract] [Full Text]; Pinson, C. Wright [Full Text]; Pointurier, Isabelle [Abstract] [Full Text]; Poldermans, Don [Abstract] [Full Text]; Poldermans, Don [Abstract] [Full Text]
R: Rambaldi, Riccardo [Abstract] [Full Text]; Reijs, Ambroos E.M. [Abstract] [Full Text]; Rietveld, Trinet [Abstract] [Full Text]; Roelandt, Jos R.T.C. [Abstract] [Full Text]; Roelandt, Jos R.T.C. [Abstract] [Full Text]; Roeske, John C. [Abstract] [Full Text]
S: Sadato, Norihiro [Abstract] [Full Text]; Saleh-Mghir, Azzam [Full Text]; Sano, Kazuo [Abstract] [Full Text]; Sarda, Laure [Full Text]; Schaadt, Bente K. [Abstract] [Full Text]; Schinkel, Arend F.L. [Abstract] [Full Text]; Sgouros, George [Abstract] [Full Text]; Shaw, Leslee J. [Abstract] [Full Text]; Shikano, Naoto [Abstract] [Full Text]; Siegel, Jeffry A. [Full Text]; Slama, Michel [Abstract] [Full Text]; Slegers, Guido [Abstract] [Full Text]; Solanki, Kishor K. [Full Text]; Sozzi, Fabiola B. [Abstract] [Full Text]; Sparks, Richard B. [Full Text]; Squeri, Shannon [Abstract] [Full Text]; Stabin, Michael G. [Full Text]; Swensson, Richard [Abstract] [Full Text]
T: Teitcher, Jerrold B. [Abstract] [Full Text]; Trébossen, Régine [Abstract] [Full Text]; Trischitta, Vincenzo [Abstract] [Full Text]
V: Valkema, Roelf [Abstract] [Full Text]; Valkema, Roelf [Abstract] [Full Text]; van der Jagt, Erik J. [Abstract] [Full Text]; van der Veer, Eveline [Abstract] [Full Text]; van Domburg, Ron [Abstract] [Full Text]; van Heeringen, Cees [Abstract] [Full Text]; Van Laere, Koen [Abstract] [Full Text]; van Leuven, Fred [Abstract] [Full Text]; Verbruggen, Alfons M. [Abstract] [Full Text]; Vervaet, Miriam [Abstract] [Full Text]; Vilain, Didier [Abstract] [Full Text]; Villemagne, Victor [Abstract] [Full Text]; von Forstner, Corinna [Abstract] [Full Text]; von Schulthess, Gustav K. [Abstract] [Full Text]; Vourvouri, Eleni C. [Abstract] [Full Text]
W: Wahab Benada, Abdel [Abstract] [Full Text]; Wahl, Richard L. [Abstract] [Full Text]; Wahl, Richard L. [Abstract] [Full Text]; Wareham, David W. [Full Text]; Willemse, Pax H.B. [Abstract] [Full Text]; Wyss, Christophe A. [Abstract] [Full Text]
Y: Yeung, David W.C. [Abstract] [Full Text]; Yonekura, Yoshiharu [Abstract] [Full Text]; Yoshida, Masanori [Abstract] [Full Text]; Yu, Simon C.H. [Abstract] [Full Text]
Z: Zaidi, Habib [Abstract] [Full Text]; Zelenetz, Andrew D. [Abstract] [Full Text]; Zingrillo, Matteo [Abstract] [Full Text]; Zuhayra, Maaz [Abstract] [Full Text]