JNM -- Index by Author (Feb 2001; Volume 42, Number 2)

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Index by Author: Feb 2001; 42 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Akinboboye, Olakunle [Abstract] [Full Text]; Alderson, Philip O. [Abstract] [Full Text]; Altmann, Annette [Abstract] [Full Text]; Anderson, Carolyn J. [Abstract] [Full Text]; Areeda, Joseph S. [Full Text]; Audenaert, Kurt [Abstract] [Full Text]; Aurengo, André [Abstract] [Full Text]
B: Bass, Laura A. [Abstract] [Full Text]; Bergmann, Steven R. [Abstract] [Full Text]; Bergmann, Steven R. [Abstract] [Full Text]; Berman, Daniel S. [Full Text]; Blankenberg, Francis G. [Abstract] [Full Text]; Boersma, Hendrikus H. [Abstract] [Full Text]; Brenner, Winfried [Abstract] [Full Text]; Budinger, Thomas F. [Abstract] [Full Text]; Buijs, Wil C.A.M. [Abstract] [Full Text]; Burger, Cyrill [Abstract] [Full Text]; Burkhart, Fred [Abstract] [Full Text]
C: Catafau, Ana M. [Abstract] [Full Text]; Chao, Yee [Abstract] [Full Text]; Chapman, J. Donald [Abstract] [Full Text]; Chen, Fu-Du [Abstract] [Full Text]; Chi, Kwan-Hwa [Abstract] [Full Text]; Chou, Ru-Ling [Abstract] [Full Text]; Chou, Shuan-Lan [Abstract] [Full Text]; Connolly, Leonard P. [Abstract] [Full Text]; Cutler, P. Duffy [Abstract] [Full Text]
D: D’Asseler, Yves [Abstract] [Full Text]; D’Hemecourt, Pierre A. [Abstract] [Full Text]; Da Silva, Angela J. [Abstract] [Full Text]; Debus, Jürgen [Abstract] [Full Text]; Dehdashti, Farrokh [Abstract] [Full Text]; Deterding, Todd A. [Abstract] [Full Text]; Dierckx, Rudi [Abstract] [Full Text]; Dimitrakopoulou-Strauss, Antonia [Abstract] [Full Text]; Domingues, Carlos [Abstract] [Full Text]; Drubach, Laura A. [Abstract] [Full Text]; Dumont, Filip [Abstract] [Full Text]
E: Eijkemans, Marinus J. [Abstract] [Full Text]; Eisenhut, Michael [Abstract] [Full Text]; El Fakhri, Georges [Abstract] [Full Text]; Eshima, Dennis [Abstract] [Full Text]; Eshima, Lori [Abstract] [Full Text]
F: Ford, Patrick V. [Full Text]
G: Garcia, Ernest V. [Full Text]; Germano, Guido [Full Text]; Goodman, Mark M. [Abstract] [Full Text]; Goodman, Simon L. [Abstract] [Full Text]; Graf, Senta [Abstract] [Full Text]; Graham, Michael M. [Full Text]
H: Haberkorn, Uwe [Abstract] [Full Text]; Haddad, Mojgan [Abstract] [Full Text]; Hasegawa, Bruce H. [Abstract] [Full Text]; Hasegawa, Shinji [Abstract] [Full Text]; Haubner, Roland [Abstract] [Full Text]; Hawkins, Randall A. [Abstract] [Full Text]; Haynes, Paul T. [Abstract] [Full Text]; Heidendal, Guido A.K. [Abstract] [Full Text]; Henze, Eberhard [Abstract] [Full Text]; Henze, Markus [Abstract] [Full Text]; Higuchi, Takahiro [Abstract] [Full Text]; Hoffman, John M. [Abstract] [Full Text]; Hofstra, Leo [Abstract] [Full Text]; Huberty, John P. [Abstract] [Full Text]; Huesman, Ronald H. [Abstract] [Full Text]
I: Iyer, Renuka V. [Abstract] [Full Text]; Izumi, Tohru [Abstract] [Full Text]
J: Jiang, Shiming [Abstract] [Full Text]
K: Kampen, Anna Maria [Abstract] [Full Text]; Kampen, Willm Uwe [Abstract] [Full Text]; Kawano, Masaya [Abstract] [Full Text]; Keil, Robert [Abstract] [Full Text]; Kemerink, Gerrit J. [Abstract] [Full Text]; Kessler, Horst [Abstract] [Full Text]; Khorsand, Aliasghar [Abstract] [Full Text]; Kijewski, Marie Foley [Abstract] [Full Text]; Kilts, Clinton D. [Abstract] [Full Text]; Knoll, Peter [Full Text]; Köhn, Horst [Full Text]; Koole, Michel [Abstract] [Full Text]; Koriska, Karl [Full Text]; Krenning, Eric P. [Abstract] [Full Text]; Kübler, Wolfgang [Abstract] [Full Text]
L: Laforest, Richard [Abstract] [Full Text]; Laine, Andrew F. [Abstract] [Full Text]; Laine, Andrew F. [Abstract] [Full Text]; Lamberts, Steven W. [Abstract] [Full Text]; Lewis, Jason S. [Abstract] [Full Text]; Liem, Ing Han [Abstract] [Full Text]; Lin, Jou-Wei [Abstract] [Full Text]; Lin, Jou-Wei [Abstract] [Full Text]; Liu, Ren-Shyan [Abstract] [Full Text]; Llaurado, Josep G. [Full Text]; Löwenberg, Bob [Abstract] [Full Text]; Lugtenburg, Pieternella J. [Abstract] [Full Text]
M: Mahmut, Miriam [Abstract] [Full Text]; Maksud, Philippe [Abstract] [Full Text]; Malveaux, Eugene [Abstract] [Full Text]; Marshall, Robert C. [Abstract] [Full Text]; Matsunaga, Naofumi [Abstract] [Full Text]; Matthay, Katherine K. [Abstract] [Full Text]; McCarthy, Deborah W. [Abstract] [Full Text]; Minoshima, Satoshi [Full Text]; Mirzaei, Siroos [Full Text]; Mitra, Avijit [Abstract] [Full Text]; Moertl, Deddo [Abstract] [Full Text]; Moore, Stephen C. [Abstract] [Full Text]; Morr, Iris [Abstract] [Full Text]; Movsas, Benjamin [Abstract] [Full Text]; Murphy, Paul [Full Text]
N: Nakajima, Kenichi [Abstract] [Full Text]; Naumovski, Louie [Abstract] [Full Text]; Nishijima, Chihiro [Abstract] [Full Text]; Nishimura, Tsunehiko [Abstract] [Full Text]
O: Oei, Hong-Yoe [Abstract] [Full Text]; Ogasawara, Nobuhiko [Abstract] [Full Text]
P: Peschke, Peter [Abstract] [Full Text]; Porenta, Gerold [Abstract] [Full Text]; Post, Anneke M. [Abstract] [Full Text]; Powers-Risius, Patricia [Abstract] [Full Text]; Price, David C. [Abstract] [Full Text]
R: Raylman, Raymond R. [Abstract] [Full Text]; Rescigno, John [Abstract] [Full Text]; Reutelingsperger, Chris P.M. [Abstract] [Full Text]; Reutter, Bryan W. [Abstract] [Full Text]
S: Sasai, Kazuhiko [Abstract] [Full Text]; Sato, Shinichi [Abstract] [Full Text]; Schneider, Richard F. [Abstract] [Full Text]; Schwaiger, Markus [Abstract] [Full Text]; Schwarz, Sally W. [Abstract] [Full Text]; Sciacca, Robert R. [Abstract] [Full Text]; Senekowitsch-Schmidtke, Reingard [Abstract] [Full Text]; Smith, Lewis G. [Abstract] [Full Text]; Sochor, Heinz [Abstract] [Full Text]; Strauss, H. William [Abstract] [Full Text]; Strauss, Ludwig G. [Abstract] [Full Text]; Suga, Kazuyoshi [Abstract] [Full Text]
T: Tait, Johnathan F. [Abstract] [Full Text]; Takehara, Kazuhiko [Abstract] [Full Text]; Taki, Junichi [Abstract] [Full Text]; Tang, H. Roger [Abstract] [Full Text]; Taylor, Scott E. [Abstract] [Full Text]; Tokita, Naoki [Abstract] [Full Text]; Tonami, Norihisa [Abstract] [Full Text]; Treves, S. Ted [Abstract] [Full Text]; Tsujimura, Eiichiro [Abstract] [Full Text]
V: Valkema, Roelf [Abstract] [Full Text]; Van Laere, Koenraad [Abstract] [Full Text]; van Putten, Wim L. [Abstract] [Full Text]; Van Train, Kenneth F. [Full Text]; VanBrocklin, Henry F. [Abstract] [Full Text]; Versijpt, Jan [Abstract] [Full Text]; Votaw, John R. [Abstract] [Full Text]
W: Wang, Chris K. [Abstract] [Full Text]; Wang, Hsin-Ell [Abstract] [Full Text]; Wang, Yu-Shan [Abstract] [Full Text]; Weber, Wolfgang [Abstract] [Full Text]; Wester, Hans-Jürgen [Abstract] [Full Text]
Y: Yen, Sang-Hue [Abstract] [Full Text]; Yutani, Kenji [Abstract] [Full Text]