JNM -- Index by Author (Oct 2000; Volume 41, Number 10)

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Index by Author: Oct 2000; 41 (10) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Alauddin, Mian M. [Abstract] [Full Text]; Amano, Shigeko [Abstract] [Full Text]; Asselin, Marie-Claude [Abstract] [Full Text]
B: Bading, James R. [Abstract] [Full Text]; Baer, Alexandra Von [Abstract] [Full Text]; Bangard, Michael [Abstract] [Full Text]; Bender, Hans [Abstract] [Full Text]; Bergström, Mats [Abstract] [Full Text]; Berridge, Marc S. [Abstract] [Full Text]; Bestetti, Alberto [Abstract] [Full Text]; Biersack, Hans-Jürgen [Abstract] [Full Text]; Blaufox, M. Donald [Abstract] [Full Text]; Bloomfield, Peter M. [Abstract] [Full Text]; Brecht-Krauss, Doris [Abstract] [Full Text]
C: Carnevali-Ricci, PierMarziano [Abstract] [Full Text]; Carola, Federica [Abstract] [Full Text]; Carpentier, Philippe [Abstract] [Full Text]; Caty, Armel [Abstract] [Full Text]; Chirakal, Raman [Abstract] [Full Text]; Connolly, Leonard P. [Abstract] [Full Text]; Conti, Peter S. [Abstract] [Full Text]
D: Dancey, Janet E. [Abstract] [Full Text]; Darcey, Terrance M. [Abstract] [Full Text]; de Jong, Marion [Abstract] [Full Text]; Decker, Pan [Abstract] [Full Text]; DeGrado, Timothy R. [Abstract] [Full Text]; Depreux, Pascal [Abstract] [Full Text]; Dewaraja, Yuni K. [Abstract] [Full Text]; DiCanzio, James [Abstract] [Full Text]; Diederichs, Christoph G. [Abstract] [Full Text]; Doppman, John L. [Abstract] [Full Text]; Drubach, Laura [Abstract] [Full Text]
E: Eberl, Stefan [Abstract] [Full Text]; Edwards, G. Keith [Abstract] [Full Text]
F: Fasth, Karl-Johan [Abstract] [Full Text]; Fazio, Ferruccio [Full Text]; Fine, Eugene J. [Abstract] [Full Text]; Fissekis, John D. [Abstract] [Full Text]; Fukuda, Hiroshi [Abstract] [Full Text]
G: Gabrys, Judy [Abstract] [Full Text]; Gibril, Fathia [Abstract] [Full Text]; Gilbert, Karen L. [Abstract] [Full Text]; Giuliano, Armando E. [Abstract] [Full Text]; Glass, Edwin C. [Abstract] [Full Text]; Goin, James E. [Abstract] [Full Text]; Goya, Tomokazu [Abstract] [Full Text]; Grünwald, Frank [Abstract] [Full Text]; Guhlmann, Albrecht [Abstract] [Full Text]
H: Haigh, Philip I. [Abstract] [Full Text]; Hansen, Nora M. [Abstract] [Full Text]; Hartwig, Erich [Abstract] [Full Text]; Heald, Donald L. [Abstract] [Full Text]; Hendler, Aaron L. [Abstract] [Full Text]; Heymer, Berno [Abstract] [Full Text]; Houle, Sylvain [Abstract] [Full Text]; Hubner, Karl F. [Abstract] [Full Text]
I: Iida, Hidehiro [Abstract] [Full Text]; Iseda, Tsutomu [Abstract] [Full Text]; Ishii, Kazunari [Abstract] [Full Text]
J: Jackson, L. Elizabeth [Abstract] [Full Text]; Jensen, Robert T. [Abstract] [Full Text]; Joung, Jinhun [Abstract] [Full Text]
K: Kitamura, Keishi [Abstract] [Full Text]; Kolesnikov-Gauthier, Hélène [Abstract] [Full Text]; Konishi, Junji [Abstract] [Full Text]; Koral, Kenneth F. [Abstract] [Full Text]; Kotzerke, Jörg [Abstract] [Full Text]; Krenning, Eric P. [Abstract] [Full Text]; Kwekkeboom, Dik [Abstract] [Full Text]
L: Laffin, Stephen P. [Abstract] [Full Text]; Lambert, Raymond [Full Text]; Landoni, Claudio [Full Text]; Långström, Bengt [Abstract] [Full Text]; Leach, Martin O. [Abstract] [Full Text]; Lee, Zhenghong [Abstract] [Full Text]; Lewis, Petra J. [Abstract] [Full Text]; Li, Yi [Abstract] [Full Text]; Lin, Eva [Abstract] [Full Text]; Ljungberg, Michael [Abstract] [Full Text]; Lu, Li [Abstract] [Full Text]; Lubensky, Irina A. [Abstract] [Full Text]; Luigi Tarolo, Gian [Abstract] [Full Text]
M: Maisey, Nick R. [Abstract] [Full Text]; Messa, Cristina [Full Text]; Mitchell, Karl [Abstract] [Full Text]; Miyahara, Daisaku [Abstract] [Full Text]; Moretti, Jean-Luc [Full Text]; Moriyama, Takuzou [Abstract] [Full Text]
N: Nahmias, Claude [Abstract] [Full Text]; Nakano, Shinichi [Abstract] [Full Text]
O: Ono, Yukihiko [Abstract] [Full Text]
P: Paul, Karen [Abstract] [Full Text]; Peghini, Paolo L. [Abstract] [Full Text]; Pozzato, Carlo [Full Text]
R: Reske, Sven N. [Abstract] [Full Text]; Reynolds, James C. [Abstract] [Full Text]; Roberts, David W. [Abstract] [Full Text]; Robillard, Pierre [Full Text]; Rockey, Donald C. [Abstract] [Full Text]; Ronen, Sabrina M. [Abstract] [Full Text]; Roy, Praveen K. [Abstract] [Full Text]
S: Sadato, Norihiro [Abstract] [Full Text]; Sambataro, Giuseppe [Abstract] [Full Text]; Sameshima, Tetsuro [Abstract] [Full Text]; Sarkar, Michael R. [Abstract] [Full Text]; Schulte, Michael [Abstract] [Full Text]; Senda, Michio [Abstract] [Full Text]; Shahinian, Antranik H. [Abstract] [Full Text]; Shepherd, Frances A. [Abstract] [Full Text]; Shiozaki, Toshiki [Abstract] [Full Text]; Siegel, Adrian M. [Abstract] [Full Text]; Siegel, Alan [Abstract] [Full Text]; Smith, Gary T. [Abstract] [Full Text]; Smith, Timothy A.D. [Abstract] [Full Text]; Sniderman, Kenneth W. [Abstract] [Full Text]; Sojkova, Jitka [Abstract] [Full Text]; Soulez, Gilles [Full Text]; Spector, Thomas [Abstract] [Full Text]; Studholme, Colin [Abstract] [Full Text]; Sulman, Charles [Abstract] [Full Text]; Suzuki, Yukiko [Abstract] [Full Text]
T: Taillefer, Raymond [Full Text]; Tamura, Yoshikazu [Abstract] [Full Text]; Tetrault, Tracy [Abstract] [Full Text]; Tewson, Tim J. [Full Text]; Thadani, Vijay M. [Abstract] [Full Text]; Thérasse, Eric [Full Text]; Thie, Joseph A. [Abstract] [Full Text]; Titley, Jennifer C. [Abstract] [Full Text]; Treves, S. Ted [Abstract] [Full Text]; Tsuchida, Tatsuro [Abstract] [Full Text]; Turpin, Sophie [Full Text]
U: Uchinokura, Syunrou [Abstract] [Full Text]
V: Vennin, Philippe [Abstract] [Full Text]
W: Wahl, Lindi M. [Abstract] [Full Text]; Wakisaka, Shinichiro [Abstract] [Full Text]; Wang, Shuyan [Abstract] [Full Text]; Weinmann, Pierre [Full Text]; Williamson, Peter D. [Abstract] [Full Text]; Willkomm, Petra [Abstract] [Full Text]
Y: Ye, Wei [Abstract] [Full Text]; Yonekura, Yoshiharu [Abstract] [Full Text]
Z: Zurakowski, David [Abstract] [Full Text]