JNM -- Index by Author (Feb 1991; Volume 32, Number 2)

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Index by Author: Feb 1991; 32 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abraham, Stephen; Ahmad, Marsood [Abstract]; Alexander, Eben, III [Abstract]; Angello, Debra A. [Abstract]; Ash, Judith [Abstract]; Athanasoulis, Theodoros [Abstract]
B: Bailey, Dale L.; Balseiro, Jesse [Abstract]; Bell, S.D.; Benson, Lee N. [Abstract]; Beresford, Beverly [Abstract]; Bernard, Lori [Abstract]; Bertrand, Alain [Abstract]; Billings, Jeffrey J. [Abstract]; Bodenheimer, Monty M. [Abstract]; Brown, B. Greg [Abstract]; Brownell, Anna Lisa [Abstract]; Budihna, Natasa [Abstract]
C: Carvalho, Paulo A. [Abstract]; Chatal, Jean-François [Abstract]; Chetanneau, Alain [Abstract]; Cole, Timothy J. [Abstract]; Collier, B. David [Abstract]; Crane, Paul D. [Abstract]
D: Dannals, Robert F. [Abstract]; Daugherty, Alan [Abstract]; de Kraku, J.; De Schepper, J. [Abstract]; Derde, M. P. [Abstract]; DeVito, Raymond P. [Abstract]; Dobbeleir, A.; Dubois, Francis [Abstract]
E: Edwards, D. Scott [Abstract]
F: Falk, Stephan [Abstract]; Fedio, Valerie A.; Fischman, Alan J. [Abstract]; Freedom, Robert M. [Abstract]; Freeman, Israel [Abstract]; Frohn, Jürgen [Abstract]; Fujita, M. [Abstract]; Fumoleau, Pierre [Abstract]
G: Geltman, Edward M. [Abstract]; Gilday, David [Abstract]; Glowniak, Jerry V. [Abstract]; Gordon, I.; Gropler, Robert J. [Abstract]; Grunwald, Andrew M. [Abstract]
H: Ham, H.R.; Hamill, James J. [Abstract]; Hasegawa, Y. [Abstract]; Heberle, Janko [Abstract]; Hegeman, Irene M. [Abstract]; Hellman, Robert S. [Abstract]; Heninger, George R. [Abstract]; Hiam, Joan; Hiyama, T. [Abstract]; Hoefnagel, C.A.; Hoffer, Paul B. [Abstract]; Holman, B. Leonard [Abstract]; Hoory, Shlomo [Abstract]; Hör, Gustav [Abstract]; Hutchinson, R.J.; Hutton, Brian F.
I: Imaoka, S. [Abstract]; Inoue, A. [Abstract]; Intenzo, Charles M. [Abstract]; Ishigami, S. [Abstract]; Ishiguro, S. [Abstract]; Isitman, Ali T. [Abstract]
J: Jacobson, Arnold F. [Abstract]; Johansen, Klaus [Abstract]; Jonckheer, M. H. [Abstract]
K: Khaw, Ban An [Abstract]; Khaw, Ban An; Kim, Hee-Joung [Abstract]; Kim, Sung M. [Abstract]; Kojima, J. [Abstract]; Kollath, Jürgen [Abstract]; Koster, Kenneth [Abstract]; Krasnow, Arthur [Abstract]; Krystal, John H. [Abstract]; Kung, Hank F. [Abstract]; Kung, Mei-Ping [Abstract]; Kusagai, H. [Abstract]
L: Larson, Steven M.; Lazewatsky, Joel [Abstract]; Lin, Jiin [Abstract]; Lippman, H. Robert [Abstract]; Liu, Bo-Li [Abstract]; Liu, Peter; Loeffler, Jay S. [Abstract]; Loew, Murray H. [Abstract]
M: Macklis, Roger M. [Abstract]; Mansfield, Paul [Abstract]; Mayer, Jean-Claude [Abstract]; Milcinski, Metka [Abstract]; Moerlein, Stephen M. [Abstract]; Morris, Kristen D.W.; Mujoo, Kalpana [Abstract]; Murray, James L. [Abstract]
N: Nagel, James S. [Abstract]; Nair, N.; Nakano, S. [Abstract]; Narula, Jagat; Natarajan, T.K. [Abstract]; Noon, George P. [Abstract]
O: Odugbesan, Ola [Abstract]; Orlandi, Cesare [Abstract]
P: Palac, Robert T. [Abstract]; Park, Chan H. [Abstract]; Patel, Neetin [Abstract]; Patel, Rajesh [Abstract]; Patrick, Shawn T. [Abstract]; Peltier, Patrick [Abstract]; Perlmutter, Neal S. [Abstract]; Peters, A.M.; Piepsz, A.; Piepsz, A. [Abstract]; Pieri, Pierluigi; Platts, Steven H. [Abstract]; Provenzale, James
R: Rabito, Carlos A. [Abstract]; Rajashekharrao, B.; Ravert, Hayden T. [Abstract]; Reba, Richard C. [Abstract]; Robbins, Mark S. [Abstract]; Rocco, Thomas P.; Rosenblum, Michael G. [Abstract]
S: Sánchez-Roa, Patricia M. [Abstract]; Sasaki, Y. [Abstract]; Schwartz, Richard B. [Abstract]; Scott, James A.; Scott, James A.; Sebastian, James L. [Abstract]; Sekela, Michael E. [Abstract]; Shapiro, B.; Siegel, Barry A. [Abstract]; Sisson, J.C.; Smallhorn, Jeffrey F. [Abstract]; Smets, L.; Smith, Eileen O. [Abstract]; Sobel, Burton E. [Abstract]; Sobue, T. [Abstract]; Southern, James F.; Spencer, Richard P.; Strauss, H. William; Strauss, H. William [Abstract]; Stutte, Hans-Jochen [Abstract]
T: Takahashi, H.; Tanaka, S. [Abstract]; Thoolen, Martin J. [Abstract]; Tilyou, Sarah M.; Todd-Pokropek, A.; Turner, Fredrick E. [Abstract]
U: Uehara, Toshiisa [Abstract]
V: Van den Broeck, M. [Abstract]; Vazquez, Silvia [Abstract]; Verani, Mario S. [Abstract]; Villemagne, Victor L. [Abstract]; Vogel, Michael [Abstract]; Voûte, P.A.; Vuilez, Jean-Philippe [Abstract]
W: Wagner, Henry N., Jr. [Abstract]; Wahl, R.L.; Wands, J.R.; Welch, Michael J. [Abstract]; Wieland, D.M.; Wilbur, D. Scott [Abstract]; Wilken, Tom [Abstract]; Willerson, James T.; Williams, William G. [Abstract]; Wilmanns, Christoph [Abstract]; Wilson, Alan A. [Abstract]; Wilson, Richard A. [Abstract]; Wolfangel, Robert G. [Abstract]; Wong, Dean F. [Abstract]; Woodhouse, Nicholas J.Y. [Abstract]; Woods, Scott W. [Abstract]
Y: Yanai, Kazuhiko [Abstract]; Yang, Yun-Yun [Abstract]; Yaoita, Hiroyuki [Abstract]; Yasuda, Tsunehiro; Yoshida, H. [Abstract]; Young, James B. [Abstract]
Z: Zeeberg, Barry R. [Abstract]; Zimmerman, Robert E. [Abstract]; Zubal, I. George [Abstract]